Peer-to-Patent is an historic patent initiative launched by New York Law School in cooperation with the US Patent and Trademark Office. The program was developed as a solution to the information deficit problem presented by the patent examination process. Under the program, the public is allowed to review published patent applications and submit annotated prior art relevant to the determination of patentability.
Due to the rigors placed upon examiners at the US Patent and Trademark Office, some non-meritorious patent applications are able to slip through the cracks and become granted patents. Post-Issue Peer-to-Patent extends the community-based approach of Peer-to-Patent to the re-examination of patents that have already been granted.
While patent databases, such as those provided by the USPTO or www.freepatents.com, provide comprehensive information about the contents of a patent—the abstract, prior art references, specification, claims, drawings, etc.—they are limited in their scope and utility. This program is aimed at increasing the usefulness of patent databases to patent offices by applying "tagging" and visualization technologies to make the information contained within the patent applications more functional and robust.